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Enhanced Fröhlich interaction of semiconductor cuprous oxide films determined by temperature‐dependent Raman scattering and spectral transmittance
Author(s) -
Yu Wenlei,
Han Meijie,
Jiang Kai,
Duan Zhihua,
Li Yawei,
Hu Zhigao,
Chu Junhao
Publication year - 2013
Publication title -
journal of raman spectroscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.748
H-Index - 110
eISSN - 1097-4555
pISSN - 0377-0486
DOI - 10.1002/jrs.4145
Subject(s) - raman spectroscopy , transmittance , raman scattering , phonon , semiconductor , oxide , substrate (aquarium) , chemistry , condensed matter physics , blueshift , analytical chemistry (journal) , materials science , optics , photoluminescence , optoelectronics , physics , organic chemistry , oceanography , chromatography , geology
Anomalous low temperature behaviors in cuprous oxide (Cu 2 O) film grown on quartz substrate have been investigated by temperature‐dependent Raman and transmittance spectra. The longitudinal optical components of two Γ 15 ‐ phonon modes become sharper and more intense at a low temperature. It can be found that the highest‐order electronic transition located at 6.4 eV exhibits a minimum transmittance near 200 K. Correspondingly, the variations from phonon intensity ratios reveal obvious anomalies with the decreasing temperature, indicating the existence of strong electron–phonon coupling mediated by Fröhlich interaction in the Cu 2 O films below the temperature of 200 K. Copyright © 2012 John Wiley & Sons, Ltd.