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Raman spectroscopy of nonstacked graphene flakes produced by plasma microjet deposition
Author(s) -
Passoni Matteo,
Russo Valeria,
Dellasega David,
Causa Federica,
Ghezzi Francesco,
Wolverson Daniel,
Bottani Carlo E.
Publication year - 2012
Publication title -
journal of raman spectroscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.748
H-Index - 110
eISSN - 1097-4555
pISSN - 0377-0486
DOI - 10.1002/jrs.3111
Subject(s) - raman spectroscopy , graphene , stacking , plasma , ultraviolet , excitation , deposition (geology) , materials science , layer (electronics) , spectroscopy , optoelectronics , analytical chemistry (journal) , nanotechnology , chemistry , optics , physics , geology , environmental chemistry , paleontology , organic chemistry , quantum mechanics , sediment
An extensive Raman investigation of few‐layer graphene structures, obtained using a plasma microjet technique, is presented. Raman spectroscopy represents a unique method to characterize specific features of these systems. Excitation energies both in the visible and in the deep ultraviolet range are exploited, allowing to extract the main structural properties of the in‐house deposited samples. Particular attention is given to the determination of the stacking order properties of these few‐layer graphene structures. The results presented here also validate the plasma microjet as an efficient deposition technique to obtain graphene‐based systems with a low number of layers and reduced coupling on well defined and spatially localized areas. Copyright © 2011 John Wiley & Sons, Ltd.