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Two‐dimensional standoff Raman measurements of distant samples
Author(s) -
Porter John N.,
Helsley Charles E.,
Sharma Shiv K.,
Misra Anupam K.,
Bates David E.,
Lienert Barry R.
Publication year - 2012
Publication title -
journal of raman spectroscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.748
H-Index - 110
eISSN - 1097-4555
pISSN - 0377-0486
DOI - 10.1002/jrs.2998
Subject(s) - raman spectroscopy , sample (material) , scanner , tilt (camera) , measure (data warehouse) , optics , grid , analytical chemistry (journal) , materials science , physics , chemistry , computer science , geology , geometry , mathematics , geodesy , data mining , chromatography , thermodynamics
A scanning standoff Raman spectroscopy system has been developed to measure the molecular species of distant samples in two dimensions. Computer software is used to control the scanner pan and tilt angles, and Raman measurements are collected of the distant sample area in an x – y grid pattern. The Raman spectra at each grid point are measured and processed to obtain an image of the distant surface composition. The ability to provide interpolated images of distant molecular species is illustrated. Copyright © 2011 John Wiley & Sons, Ltd.