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A novel combinative Raman and SEM mapping method for the detection of exfoliation of graphite in electrodes at very positive potentials
Author(s) -
Hintennach Andreas,
Novák Petr
Publication year - 2011
Publication title -
journal of raman spectroscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.748
H-Index - 110
eISSN - 1097-4555
pISSN - 0377-0486
DOI - 10.1002/jrs.2930
Subject(s) - raman spectroscopy , exfoliation joint , scanning electron microscope , graphite , electrode , materials science , microscopy , characterization (materials science) , lithium (medication) , analytical chemistry (journal) , nanotechnology , chemistry , optics , composite material , graphene , chromatography , physics , medicine , endocrinology
The random exfoliation at very positive potentials (>5 V vs Li/Li + ) of graphite (used as a conductive component in positive electrodes of lithium‐ion batteries) was investigated with in situ Raman microscopy and post mortem scanning electron microscopy (SEM). A novel semiautomated computational method for the data analysis of both characterization methods was developed to correlate Raman and SEM information with good lateral resolution, in order to locate exfoliated graphite particles. Proof is given that the exfoliating particles detected via the semiautomatic in situ Raman microscopy mappings correctly describes exfoliated areas, as confirmed via post mortem SEM pictures. Copyright © 2011 John Wiley & Sons, Ltd.