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Tip‐enhanced Raman spectroscopy using single‐crystalline Ag nanowire as tip
Author(s) -
You Yumeng,
Purnawirman N. A.,
Hu Hailong,
Kasim Johnson,
Yang Huanping,
Du Chaoling,
Yu Ting,
Shen Zexiang
Publication year - 2010
Publication title -
journal of raman spectroscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.748
H-Index - 110
eISSN - 1097-4555
pISSN - 0377-0486
DOI - 10.1002/jrs.2559
Subject(s) - raman spectroscopy , nanowire , materials science , raman scattering , nanotechnology , nanometre , characterization (materials science) , dielectrophoresis , spectroscopy , optoelectronics , optics , composite material , physics , quantum mechanics , microfluidics
Abstract We report the surface‐enhanced Raman scattering (SERS) effect from the apex of single‐crystalline Ag nanowires (NWs). We also fabricated tip‐enhanced Raman spectroscopy (TERS) tips by attaching individual Ag NWs to W wires by using the alternating current dielectrophoresis (AC‐DEP) method. The single‐crystalline Ag NW tips could overcome many of the shortcomings of conventional TERS tips. Most importantly, the results obtained from TERS using single‐crystalline metal NWs are very reproducible, and the tips are also reusable. This development represents a significant progress in making TERS a reliable optical characterization technique with nanometer spatial resolution. Copyright © 2010 John Wiley & Sons, Ltd.