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Calculation of off‐resonance Raman scattering intensities with parametric models
Author(s) -
Bougeard Daniel,
Smirnov Konstantin S.
Publication year - 2009
Publication title -
journal of raman spectroscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.748
H-Index - 110
eISSN - 1097-4555
pISSN - 0377-0486
DOI - 10.1002/jrs.2527
Subject(s) - raman spectroscopy , raman scattering , parametric statistics , transferability , polarizability , intensity (physics) , resonance (particle physics) , field (mathematics) , materials science , opacity , chemistry , optics , physics , computer science , atomic physics , molecule , organic chemistry , mathematics , statistics , logit , machine learning , pure mathematics
Abstract The paper reviews applications of parametric models for calculations of the Raman scattering intensity of materials with the main emphasis on the performance of the bond polarizability model. The use of the model in studies of polymers, aluminosilicates, and nanostructures is discussed and the existing sets of electro‐optical parameters as well as their transferability are analyzed. The paper highlights the interplay between the first‐principles and parametric approaches to the Raman intensity calculations and suggests further developments in this field. Copyright © 2009 John Wiley & Sons, Ltd.