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Tip‐Enhanced Raman Spectroscopy
Author(s) -
Deckert V.
Publication year - 2009
Publication title -
journal of raman spectroscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.748
H-Index - 110
eISSN - 1097-4555
pISSN - 0377-0486
DOI - 10.1002/jrs.2452
Subject(s) - raman spectroscopy , snapshot (computer storage) , field (mathematics) , nanotechnology , computer science , data science , engineering physics , materials science , physics , optics , mathematics , pure mathematics , operating system
This special issue of the Journal of Raman Spectroscopy deals with the advances of Tip‐Enhanced Raman Spectroscopy (TERS) since its experimental verification about 10 years ago. The contributed papers reflect a snapshot of current research related to experimental, theoretical and, last but not least, application‐oriented advances in this field. The contributions highlight the fact that TERS is a very active field of research and, while the rewards with respect to lateral resolution and detection limits are intriguing, great care is necessary to avoid the pitfalls related either to the experimental design or to the interpretation of data. This special issue intends to provide the basis for a further step towards a standardised approach to TERS. Copyright © 2009 John Wiley & Sons, Ltd.