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Surface‐enhanced Raman spectroscopy on novel black silicon‐based nanostructured surfaces
Author(s) -
Talian Ivan,
Mogensen Klaus Bo,
Oriňák Andrej,
Kaniansky Dušan,
Hübner Jörg
Publication year - 2009
Publication title -
journal of raman spectroscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.748
H-Index - 110
eISSN - 1097-4555
pISSN - 0377-0486
DOI - 10.1002/jrs.2213
Subject(s) - rhodamine 6g , raman spectroscopy , black silicon , silicon , materials science , surface enhanced raman spectroscopy , layer (electronics) , analytical chemistry (journal) , thin film , optoelectronics , nanotechnology , chemistry , raman scattering , optics , molecule , physics , organic chemistry , chromatography
Two different black silicon nanostructured surfaces modified with thin gold layers were tested for analytical signal enhancement with Surface‐Enhanced Raman Spectroscopy (SERS). The relationship between the thicknesses of the gold layers and the analytical signal enhancement was studied. Also, effects of Ti and Ti/Pt adhesion layers underneath the gold layers on the analytical signal enhancement were tested. An enhancement factor of 7.6 × 10 7 with the excitation laser 785 nm was achieved for the tested analyte, Rhodamine 6G, and non‐resonance SER spectra were recorded in a 5 s acquisition mode. Such an enhancement enables to achieve a detection limit down to 2.4 pg of Rhodamine 6G on a black silicon‐based nanosurface coated with a 400‐nm‐thin layer of gold. Copyright © 2009 John Wiley & Sons, Ltd.

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