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A new quantitative Raman measurement scheme using Teflon as a novel intensity correction standard as well as the sample container
Author(s) -
Nah Sanghee,
Kim Donghyuk,
Chung Hoeil,
Han SungHwan,
Yoon MoonYoung
Publication year - 2007
Publication title -
journal of raman spectroscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.748
H-Index - 110
eISSN - 1097-4555
pISSN - 0377-0486
DOI - 10.1002/jrs.1667
Subject(s) - raman spectroscopy , reproducibility , sample (material) , intensity (physics) , laser , optics , analytical chemistry (journal) , materials science , reliability (semiconductor) , chemistry , power (physics) , chromatography , physics , quantum mechanics
A novel and reliable quantitative Raman measurement scheme has been proposed for the analyses of ethanol and isopropanol solutions. Teflon tubing was employed as an effective intensity correction standard as well as the sample cell. This allowed for the synchronous collection of the mixed Raman spectrum from the Teflon standard and the sample without any extra optical configuration. A non‐overlapping Teflon band was used as the standard peak to correct the Raman intensity changes resulting from laser power variations. In addition to the use of Teflon tubing,a wide area illumination (WAI) scheme was employed, which made the laser illumination into a circle of 6 mm diameter (area: 28.7 mm 2 ), to cover a wide sample area. The WAI scheme improved the reliability of the Raman measurement by significantly increasing the reproducibility of the sampling owing to a decreased sensitivity to sample placement with respect to the focal plane as well as a wider sample coverage area. The resulting Raman spectra were more reproducible and more representative of the correct sample composition. Overall, a superior prediction performance was achieved using the WAI scheme compared to the conventional Raman collection method. The proposed system has great potential for use in the quantitative analysis of diverse liquid samples with good reproducibility. Copyright © 2006 John Wiley & Sons, Ltd.