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A novel method for measuring distribution of orientation of one‐dimensional ZnO using resonance Raman spectroscopy
Author(s) -
Zhang Xinghua,
Liu Yichun,
Chen Shihao
Publication year - 2005
Publication title -
journal of raman spectroscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.748
H-Index - 110
eISSN - 1097-4555
pISSN - 0377-0486
DOI - 10.1002/jrs.1413
Subject(s) - raman spectroscopy , resonance raman spectroscopy , materials science , orientation (vector space) , resonance (particle physics) , spectroscopy , nuclear magnetic resonance , analytical chemistry (journal) , chemistry , optics , physics , geometry , atomic physics , mathematics , chromatography , quantum mechanics
A spectroscopic method of characterizing the growth orientation of low‐dimensional ZnO structures is proposed on the basis of the angular dispersion of polar phonon modes. According to this approach, the orientational distribution of a randomly oriented one‐dimensional ZnO structure can be measured quantitatively by studying the line‐shape of polar phonon bands. Multiphonon resonance Raman spectroscopy was used to investigate the details of the polar optical phonon mode. Copyright © 2005 John Wiley & Sons, Ltd.