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Micro‐Raman spectroscopy of sol–gel‐derived Pb(Zr x Ti 1 − x )O 3 thin films
Author(s) -
Agrawal D. C.,
Majumder S. B.,
Mohapatra Y. N.,
Sathaiah S.,
Bist H. D.,
Katiyar R. S.,
ChingPrado E.,
Reynes A.
Publication year - 1993
Publication title -
journal of raman spectroscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.748
H-Index - 110
eISSN - 1097-4555
pISSN - 0377-0486
DOI - 10.1002/jrs.1250240713
Subject(s) - raman spectroscopy , materials science , sapphire , thin film , sol gel , quartz , ferroelectricity , analytical chemistry (journal) , substrate (aquarium) , perovskite (structure) , diffraction , mineralogy , crystallography , optics , chemistry , nanotechnology , composite material , optoelectronics , laser , organic chemistry , dielectric , physics , oceanography , geology
Thin films of ferroelectric PbZr x Ti 1 − x O 3 were prepared by the sol–gel technique on sapphire and fused‐quartz substrates with thicknesses ranging from 0.6 to 1.2 μm. Powders of the above substance were also prepared by hydrolysis and condensation of the same precursor sol and crystallized by holding them at 600°C for either 6 or 12 h. From a comparison of the Raman spectra it is obvious that both powders and the film on sapphire substrate belong to the perovskite structure, whereas the film on fused quartz has a phyrochlore structure. These observations agree well with x‐ray measurements of diffraction patterns. Absence of 70 cm −1 E (TO) band in the film suggests that the film is rhombohedral with x being well above 0.535.