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Enhancement of resonance Raman scattering from crystal violet deposited on island silver films
Author(s) -
Chou Y. C.,
Liang N. T.,
Tse W. S.
Publication year - 1986
Publication title -
journal of raman spectroscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.748
H-Index - 110
eISSN - 1097-4555
pISSN - 0377-0486
DOI - 10.1002/jrs.1250170611
Subject(s) - raman scattering , crystal violet , resonance (particle physics) , raman spectroscopy , excitation , crystal (programming language) , surface roughness , scattering , metal , chemistry , analytical chemistry (journal) , normalization (sociology) , materials science , molecular physics , optics , atomic physics , physics , sociology , anthropology , medicine , organic chemistry , pathology , quantum mechanics , chromatography , computer science , composite material , programming language
The observed thickness dependence and excitation profiles of the surface‐enhanced resonance Raman scattering (SERRS) from crystal violet (CV) on silver films demonstrated the importance of surface roughness and chemical effects. Using different normalization schemes in studying the excitation profile of SERRS we were able to identify that there are three multiplicative contributions to the observed overall enhancement, viz. the electromagnetic effect, the molecular resonance effect and the charge‐transfer effect originating from the strong electronic interactions between CV and the metal islands.