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Chromium oxide film thickness measurements using spontaneous Raman scattering
Author(s) -
England W. A.,
Jenny S. N.,
Greenhalgh D. A.
Publication year - 1984
Publication title -
journal of raman spectroscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.748
H-Index - 110
eISSN - 1097-4555
pISSN - 0377-0486
DOI - 10.1002/jrs.1250150305
Subject(s) - raman scattering , raman spectroscopy , chromium , materials science , oxide , analytical chemistry (journal) , argon , metallurgy , optics , chemistry , environmental chemistry , physics , organic chemistry
Quantitative measurements of chromium oxide film thicknesses on pure chromium have been made using Raman scattering. The results are compared with those from argon ion erosion. Possible developments of the technique to the chemical mapping of corrosion film using Raman scuttering are discussed.