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Raman spectral characterization of pure and fluorine‐doped vitreous silica material
Author(s) -
Dumas P.,
Corset J.,
Levy Y.,
Neuman V.
Publication year - 1982
Publication title -
journal of raman spectroscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.748
H-Index - 110
eISSN - 1097-4555
pISSN - 0377-0486
DOI - 10.1002/jrs.1250130207
Subject(s) - raman spectroscopy , fluorine , dopant , doping , tetrahedron , characterization (materials science) , refractive index , materials science , analytical chemistry (journal) , spectroscopy , chemistry , optics , crystallography , optoelectronics , nanotechnology , organic chemistry , physics , metallurgy , quantum mechanics
Fluorine doped silica samples have been investigated by Raman spectroscopy. The results obtained allow us to propose a model for dopant incorporation in the silica network, involving the formation of SiO 3 F tetrahedron. A relationship between the intensity of the ν(Si‐F) stretching vibration band and the refractive index is presented.