Structural characterization of self‐assembled monolayers by unenhanced Raman spectroscopy | Zendy

Choplin F. | Zendy; Navarre S. | Zendy; Bousbaa J. | Zendy; Babin P. | Zendy; Bennetau B. | Zendy; Bruneel J.L. | Zendy; Desbat B. | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Premium

Structural characterization of self‐assembled monolayers by unenhanced Raman spectroscopy

Author(s) -

Choplin F.,

Navarre S.,

Bousbaa J.,

Babin P.,

Bennetau B.,

Bruneel J.L.,

Desbat B.

Publication year - 2003

Publication title -

journal of raman spectroscopy

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.748

H-Index - 110

eISSN - 1097-4555

pISSN - 0377-0486

DOI - 10.1002/jrs.1073

Subject(s) - monolayer , raman spectroscopy , wafer , characterization (materials science) , micrometer , microscopy , chemistry , analytical chemistry (journal) , silicon , raman microscope , self assembled monolayer , homogeneous , nanotechnology , materials science , crystallography , raman scattering , optics , organic chemistry , physics , thermodynamics

This paper presents unenhanced Raman spectra of self‐assembled monolayers [2‐(22‐trichlorosilanyldocosoxy)ethyl acetate], grafted on to silicon dioxide wafers, obtained by using a confocal Raman microscope. The quality of monolayer formation, at the micrometer scale, was monitored by drawing maps of a few square micrometers and homogeneous monolayers were obtained using a detergent cleaning procedure. The results are in good agreement with those obtained previously by atomic force microscopy studies. Copyright © 2003 John Wiley & Sons, Ltd.

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here

Accelerating Research