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Structural characterization of self‐assembled monolayers by unenhanced Raman spectroscopy
Author(s) -
Choplin F.,
Navarre S.,
Bousbaa J.,
Babin P.,
Bennetau B.,
Bruneel J.L.,
Desbat B.
Publication year - 2003
Publication title -
journal of raman spectroscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.748
H-Index - 110
eISSN - 1097-4555
pISSN - 0377-0486
DOI - 10.1002/jrs.1073
Subject(s) - monolayer , raman spectroscopy , wafer , characterization (materials science) , micrometer , microscopy , chemistry , analytical chemistry (journal) , silicon , raman microscope , self assembled monolayer , homogeneous , nanotechnology , materials science , crystallography , raman scattering , optics , organic chemistry , physics , thermodynamics
This paper presents unenhanced Raman spectra of self‐assembled monolayers [2‐(22‐trichlorosilanyldocosoxy)ethyl acetate], grafted on to silicon dioxide wafers, obtained by using a confocal Raman microscope. The quality of monolayer formation, at the micrometer scale, was monitored by drawing maps of a few square micrometers and homogeneous monolayers were obtained using a detergent cleaning procedure. The results are in good agreement with those obtained previously by atomic force microscopy studies. Copyright © 2003 John Wiley & Sons, Ltd.