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The electric field at the apex of a near‐field probe: implications for nano‐Raman spectroscopy
Author(s) -
Hallen H. D.,
Jahncke C. L.
Publication year - 2003
Publication title -
journal of raman spectroscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.748
H-Index - 110
eISSN - 1097-4555
pISSN - 0377-0486
DOI - 10.1002/jrs.1048
Subject(s) - raman spectroscopy , near field scanning optical microscope , spectroscopy , electric field , nano , field (mathematics) , optics , near and far field , materials science , microscopy , surface enhanced raman spectroscopy , raman scattering , optical microscope , nanotechnology , analytical chemistry (journal) , chemistry , physics , scanning electron microscope , chromatography , quantum mechanics , pure mathematics , composite material , mathematics
Near‐field or nano‐Raman spectroscopy is different from its far‐field counterpart in several important respects. We present a unified view of nano‐Raman spectroscopy that accounts for these differences, which include surface enhancement, propagation differences, the presence of z ‐polarized light, and electric field gradients that give rise to new spectroscopic selection rules. We also discuss some of the recent advances in near‐field scanning optical microscopy (NSOM) and their positive impact on nano‐Raman spectroscopy. In particular, progress has been made in fabricating better probes, both apertured and apertureless, for NSOM, resulting in larger signal levels important for Raman spectroscopy. Larger signals result in shorter imaging times, the ability to achieve higher resolution and broader applicability of the technique. Copyright © 2003 John Wiley & Sons, Ltd.