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Estimation of the thickness of films used in electron microscopy
Author(s) -
Weibull C.
Publication year - 1972
Publication title -
zeitschrift für allgemeine mikrobiologie
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.58
H-Index - 54
eISSN - 1521-4028
pISSN - 0044-2208
DOI - 10.1002/jobm.19720120607
Subject(s) - electron microscope , electron , microtome , materials science , optics , scanning electron microscope , microscope , electron beam induced deposition , cathode ray , microscopy , low voltage electron microscope , fraction (chemistry) , scanning transmission electron microscopy , composite material , chemistry , physics , chromatography , quantum mechanics
Carbon films or thin sections of plastic materials were introduced into the electron beam of an electron microscope and the fraction of electrons scattered enough not to reach the fluorescent screen was estimated by means of the exposure meter of the microscope. The values obtained showed that a simple relationship existed between the fraction of electrons scattered and the thickness of the sections (films) as estimated with a microtome or otherwise. In this way, film thicknesses between about 5 and 130 nm can rapidly be estimated. However, when sectioned material is studied, areas free of embedded material must be present in the sections.