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Integrated deterministic and stochastic simulation of electronic circuits: Application to large signal–noise analysis
Author(s) -
Kriplani Nikhil M.,
Luniya Sonali R.,
Steer Michael B.
Publication year - 2008
Publication title -
international journal of numerical modelling: electronic networks, devices and fields
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.249
H-Index - 30
eISSN - 1099-1204
pISSN - 0894-3370
DOI - 10.1002/jnm.674
Subject(s) - noise (video) , white noise , effective input noise temperature , electronic engineering , low noise amplifier , amplifier , transient (computer programming) , signal (programming language) , power (physics) , computer science , noise temperature , noise figure , stochastic resonance , compression (physics) , electrical engineering , engineering , telecommunications , physics , phase noise , cmos , quantum mechanics , artificial intelligence , image (mathematics) , programming language , operating system , thermodynamics
The ability to model the effect of non‐negligible levels of white noise superimposed on a carrier is investigated when this signal–noise combination is fed to the input of an MMIC power amplifier. Transient simulation using stochastic differential equations is introduced here to handle large levels of noise of arbitrary frequency characteristics. The effectiveness of the modelling is ascertained by looking at measured gain‐compression plots at the output of the amplifier and comparing these with simulated results. It is found that increasing levels of noise introduce increased compression of the output power characteristic. Copyright © 2008 John Wiley & Sons, Ltd.