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Transmission‐line matrix models for solving transient problems of diffusion with recombination
Author(s) -
Gui Xiang,
de Cogan Donard
Publication year - 2003
Publication title -
international journal of numerical modelling: electronic networks, devices and fields
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.249
H-Index - 30
eISSN - 1099-1204
pISSN - 0894-3370
DOI - 10.1002/jnm.511
Subject(s) - transmission line , inductance , shunt (medical) , computation , capacitance , electric power transmission , transient (computer programming) , computer science , physics , algorithm , electronic engineering , mathematics , voltage , telecommunications , electrical engineering , engineering , medicine , electrode , quantum mechanics , cardiology , operating system
Starting from the general telegrapher's equation, we investigate two nodal network constructions for modelling diffusion with recombination by means of the transmission‐line matrix (TLM) method. The diffusion effect is modelled by the series and shunt capacitance in one approach, and by the series inductance and shunt resistance in the other. Both approaches use the series and shunt resistances to model the recombination effect. The constraint of using both TLM networks for solving transient problems of diffusion with recombination is found to be identical in terms of the physics behind the numerical routines. A practical way of determining the spatial resolution and iteration time step for accurate TLM numerical computations is suggested based on a simple frequency analysis. Copyright © 2003 John Wiley & Sons, Ltd.