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Fast time‐domain characterization of finite size microstrip structures
Author(s) -
Aygün K.,
Shanker B.,
Michielssen E.
Publication year - 2002
Publication title -
international journal of numerical modelling: electronic networks, devices and fields
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.249
H-Index - 30
eISSN - 1099-1204
pISSN - 0894-3370
DOI - 10.1002/jnm.472
Subject(s) - microstrip , lossless compression , dielectric , domain (mathematical analysis) , physics , time domain , mathematical analysis , computational complexity theory , topology (electrical circuits) , mathematics , computer science , algorithm , combinatorics , optics , data compression , optoelectronics , computer vision
A new fast integral‐equation‐based scheme for analysing electromagnetic transients on finite size microstrip structures is described. The scheme permits the analysis of structures comprised of perfect electrically conducting surfaces and wires along with lossless but potentially inhomogeneous dielectric regions. For typical microstrip structures, the computational complexity of the proposed analysis tool grows as O ( N t N sv log 2 N sv ), where N t denotes the number of time steps in the analysis, N sv = N s + N v , and N s and N v represent the number of spatial unknowns that model currents on conducting surfaces/wires/junctions and in penetrable volumes, respectively. This complexity estimate is in stark contrast with that for classical marching‐on‐in‐time solvers, which require O ( N t N sv 2 ) CPU resources. Copyright © 2002 John Wiley & Sons, Ltd.