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Sensitivity analysis and uncertainty estimation in small‐signal modeling for InP HBT (invited paper)
Author(s) -
Cao KeJing,
Zhang Ao,
Gao JianJun
Publication year - 2020
Publication title -
international journal of numerical modelling: electronic networks, devices and fields
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.249
H-Index - 30
eISSN - 1099-1204
pISSN - 0894-3370
DOI - 10.1002/jnm.2851
Subject(s) - heterojunction bipolar transistor , sensitivity (control systems) , signal (programming language) , range (aeronautics) , extraction (chemistry) , electronic engineering , biological system , materials science , computer science , engineering , chemistry , electrical engineering , chromatography , transistor , voltage , bipolar junction transistor , composite material , programming language , biology
In this paper, a sensitivity analysis and uncertainty estimation of small‐signal model for InP HBT is presented. Analytical expressions for sensitivity are derived in terms of the measured S‐parameters based on the direct intrinsic parameters extraction. Furthermore, the uncertainties of the intrinsic parameters vs frequency are discussed to give more reliable extraction results. The optimal solutions of the parameters are obtained by utilizing sensitivity analysis. In the frequency range of 45 MHz‐40GHz, good fits between the measured and modeled S‐parameters are achieved for 5 × 5μm 2 InP HBT.