Numerical modeling and uncertainty analysis of transistor noise‐parameter measurements | Zendy

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Numerical modeling and uncertainty analysis of transistor noise‐parameter measurements

Author(s) -

Randa James

Publication year - 2014

Publication title -

international journal of numerical modelling: electronic networks, devices and fields

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.249

H-Index - 30

eISSN - 1099-1204

pISSN - 0894-3370

DOI - 10.1002/jnm.2039

Subject(s) - monte carlo method , noise (video) , context (archaeology) , computer science , statistical physics , numerical analysis , electronic engineering , physics , engineering , mathematics , statistics , artificial intelligence , paleontology , mathematical analysis , image (mathematics) , biology

Summary This paper provides an overview of the use of noise parameters as a numerical model to represent the noise characteristics of transistors, particularly in the context of a Monte Carlo evaluation of the uncertainties in noise‐parameter measurements. The Monte Carlo also relies on a numerical model of the measurement process, in order to generate simulated measurement results, and this numerical model is also reviewed. Copyright © 2014 John Wiley & Sons, Ltd.

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