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Numerical modeling and uncertainty analysis of transistor noise‐parameter measurements
Author(s) -
Randa James
Publication year - 2014
Publication title -
international journal of numerical modelling: electronic networks, devices and fields
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.249
H-Index - 30
eISSN - 1099-1204
pISSN - 0894-3370
DOI - 10.1002/jnm.2039
Subject(s) - monte carlo method , noise (video) , context (archaeology) , computer science , statistical physics , numerical analysis , electronic engineering , physics , engineering , mathematics , statistics , artificial intelligence , paleontology , mathematical analysis , image (mathematics) , biology
Summary This paper provides an overview of the use of noise parameters as a numerical model to represent the noise characteristics of transistors, particularly in the context of a Monte Carlo evaluation of the uncertainties in noise‐parameter measurements. The Monte Carlo also relies on a numerical model of the measurement process, in order to generate simulated measurement results, and this numerical model is also reviewed. Copyright © 2014 John Wiley & Sons, Ltd.