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An efficient approximation for arbitrary port suppression of multiport scattering parameters
Author(s) -
Zadehgol Ata
Publication year - 2013
Publication title -
international journal of numerical modelling: electronic networks, devices and fields
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.249
H-Index - 30
eISSN - 1099-1204
pISSN - 0894-3370
DOI - 10.1002/jnm.1910
Subject(s) - solver , interconnection , matrix (chemical analysis) , scattering , computer science , broadband , signal integrity , scattering parameters , port (circuit theory) , signal (programming language) , process (computing) , range (aeronautics) , algorithm , electronic engineering , physics , mathematical optimization , mathematics , telecommunications , engineering , optics , materials science , aerospace engineering , composite material , programming language , operating system
SUMMARY The multiport scattering (S‐) parameter matrix is increasingly utilized to compose models of large bit‐width interconnect systems with broadband characteristics (frequency range of zero to tens of gigahertz) to perform increasingly accurate signal‐integrity and power‐integrity simulations. The search for an optimal solution space often requires generation of S‐parameter models of interconnect systems for various signal/ground pin mappings, a process that can be computationally costly if the structure is electromagnetically solved for each distinct pin mapping. To expedite this model‐generation process, we propose a method in which an N ‐port structure is electromagnetically solved only once to yield an N  ×  N S‐matrix; then, a linear system is formulated and solved to yield an ( N  −  M ) × ( N  −  M ) post‐suppressed S‐matrix (where M is the number of suppressed ports). This approach results in significant computational savings through elimination of electromagnetic field‐solver runs for each distinct pin mapping. Included in this paper is a discussion about the limitations of this technique and several numerical examples. Copyright © 2013 John Wiley & Sons, Ltd.

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