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Multi‐turn time‐of‐flight mass spectrometers with electrostatic sectors
Author(s) -
Toyoda Michisato,
Okumura Daisuke,
Ishihara Morio,
Katakuse Itsuo
Publication year - 2003
Publication title -
journal of mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.475
H-Index - 121
eISSN - 1096-9888
pISSN - 1076-5174
DOI - 10.1002/jms.546
Subject(s) - mass spectrometry , hybrid mass spectrometer , quadrupole mass analyzer , chemistry , time of flight , spectrometer , quadrupole , resolution (logic) , ion , time of flight mass spectrometry , turn (biochemistry) , analytical chemistry (journal) , triple quadrupole mass spectrometer , secondary ion mass spectrometry , optics , atomic physics , selected reaction monitoring , tandem mass spectrometry , physics , ionization , biochemistry , organic chemistry , chromatography , artificial intelligence , computer science
The mass resolution of a time‐of‐flight (TOF) mass spectrometer is directly proportional to its total flight pathlength. Multi‐turn or multi‐passage ion optical geometries are necessary to obtain fight distances of sufficient length within reasonable size limitations. We have investigated ion optics for a multi‐turn TOF mass spectrometer with electrostatic sectors. The concept of ‘perfect’ focusing conditions is introduced. Furthermore, a new type of multi‐turn TOF mass spectrometer, the MULTUM Linear plus, was developed. It consists of four cylindrical electric sectors and 28 electric quadrupole lenses. It has a vacuum chamber 60 × 70 × 20 cm in size. Mass resolution is demonstrated to increase according to the number of ion cycles. A mass resolution of 350 000 ( m / z = 28, FWHM) was achieved after 501.5 cycles. The MULTUM Linear plus analyzer is not simple, however; 28 electric quadrupole lenses are used. In order to reduce the number of ion optical parts, an improved multi‐turn TOF mass spectrometer, the MULTUM II, consisting of only four toroidal electric sectors, was also developed. The possibility of tandem mass spectrometric applications using multi‐turn TOF mass spectrometers is also discussed. Copyright © 2003 John Wiley & Sons, Ltd.