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Structural characterization and isomer differentiation of chalcones by electrospray ionization tandem mass spectrometry
Author(s) -
Zhang Junmei,
Brodbelt Jennifer S.
Publication year - 2003
Publication title -
journal of mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.475
H-Index - 121
eISSN - 1096-9888
pISSN - 1076-5174
DOI - 10.1002/jms.472
Subject(s) - chemistry , electrospray ionization , tandem mass spectrometry , mass spectrometry , characterization (materials science) , protein mass spectrometry , tandem , extractive electrospray ionization , electrospray , top down proteomics , chromatography , nanotechnology , materials science , composite material
A series of chalcones were characterized by electrospray ionization tandem mass spectrometry (MS n ). Several ionization modes were evaluated, including protonation, deprotonation and metal complexation, with metal complexation being the most efficient. Collision‐activated dissociation (CAD) was used to characterize the structures, and losses commonly observed include H 2 , H 2 O, CO and CO 2 , in addition to methyl radicals for the methoxy‐containing chalcones. CAD of the metal complexes, especially [Co II (chalcone—H) 2,2′‐bipyridine] + , allowed the most effective differentiation of the isomeric chalcones with several diagnostic fragment ions appearing upon activation of the metal complexes. MS n experiments were performed to support identification of some fragment ions and to verify the proposed fragmentation pathways. In several cases, MS n indicated that specific neutral losses occurred by stepwise pathways, such as the neutral loss of 44 u as CH 3 · and HCO · , or CH 4 and CO, in addition to CO 2 . Copyright © 2003 John Wiley & Sons, Ltd.