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Secondary ion and laser ablation mass spectrometry for the quantitative characterization of styrene–butadiene copolymers
Author(s) -
Ruch D.,
Muller J. F.,
Migeon H. N.,
Boes C.,
Zimmer R.
Publication year - 2003
Publication title -
journal of mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.475
H-Index - 121
eISSN - 1096-9888
pISSN - 1076-5174
DOI - 10.1002/jms.399
Subject(s) - chemistry , copolymer , mass spectrometry , analytical chemistry (journal) , styrene , styrene butadiene , polystyrene , ion , fourier transform ion cyclotron resonance , natural rubber , monomer , laser ablation , characterization (materials science) , laser , chromatography , materials science , polymer , organic chemistry , optics , nanotechnology , physics
Styrene–butadiene copolymers were analyzed by static secondary ion mass spectrometry (S‐SIMS) and laser ablation Fourier transform ion cyclotron resonance mass spectrometry (LA‐FTICRMS) to obtain quantitative information based on specific ions. Silver deposition was performed on polystyrene, butadiene rubber and styrene–butadiene rubber. Under these experimental conditions, new secondary ions were detected, in particular silver‐cationized butadiene [M butadiene − Ag] + and styrene [M styrene − Ag] + monomers. In contrast, LA‐FTICRMS experiments did not require pretreatment. At high laser power density, UV photons (193, 266 and 355 nm) allowed the detection of styrene and butadiene monomers at m / z 104 and 54, respectively. The use of the observed ions by SIMS or LA‐FTICRMS ensures that quantitative information on the relative distribution of each monomer is obtained. However, the silver coating thickness in the SIMS experiment seems to have an important influence on the quantitative information obtained. For LA‐FTICRMS experiments, the best results are obtained at a wavelength of 355 nm. Copyright © 2003 John Wiley & Sons, Ltd.