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Twin‐jet electropolishing for damage‐free transmission electron microscopy specimen preparation of metallic microwires
Author(s) -
Pourbabak Saeid,
Orekhov Andrey,
Schryvers Dominique
Publication year - 2021
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/jemt.23588
Subject(s) - electropolishing , materials science , transmission electron microscopy , opacity , composite material , jet (fluid) , metal , electron microscope , scanning electron microscope , optics , metallurgy , nanotechnology , electrode , chemistry , physics , electrolyte , thermodynamics
A method to prepare TEM specimens from metallic microwires and based on conventional twin‐jet electropolishing is introduced. The wire is embedded in an opaque epoxy resin medium and the hardened resin is mechanically polished to reveal the wire on both sides. The resin containing wire is then cut into discs of the appropriate size. The obtained embedded wire is electropolished in a conventional twin‐jet electropolishing machine until electron transparency in large areas without radiation damage is achieved.