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High resolution SEM characterization of nano‐precipitates in ODS steels
Author(s) -
Jóźwik Iwona,
StrojnyNędza Agata,
Chmielewski Marcin,
Pietrzak Katarzyna,
Kurpaska Łukasz,
Nosewicz Szymon
Publication year - 2018
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/jemt.23004
Subject(s) - microstructure , characterization (materials science) , materials science , scanning electron microscope , nano , oxide , dispersion (optics) , metallurgy , nanotechnology , composite material , optics , physics
The performance of the present‐day scanning electron microscopy (SEM) extends far beyond delivering electronic images of the surface topography. Oxide dispersion strengthened (ODS) steel is on of the most promising materials for the future nuclear fusion reactor because of its good radiation resistance, and higher operation temperature up to 750°C. The microstructure of ODS should not exceed tens of nm, therefore there is a strong need in a fast and reliable technique for their characterization. In this work, the results of low‐kV SEM characterization of nanoprecipitates formed in the ODS matrix are presented. Application of highly sensitive photo‐diode BSE detector in SEM imaging allowed for the registration of single nm‐sized precipitates in the vicinity of the ODS alloys. The composition of the precipitates has been confirmed by TEM‐EDS.