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A graphic approach to the analysis of a large X‐ray microanalysis dataset obtained via SEM–EDS
Author(s) -
Parkhimovich N. Yu.,
Salikhov A.R.,
Imayev M.F.
Publication year - 2017
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/jemt.22897
Subject(s) - microanalysis , software , representation (politics) , phase (matter) , computer science , computation , graphical user interface , x ray , electron probe microanalysis , analytical chemistry (journal) , materials science , biological system , computational science , chemistry , optics , scanning electron microscope , physics , algorithm , chromatography , composite material , biology , programming language , organic chemistry , politics , political science , law
A graphical method for phase analysis of advanced materials by EDS–SEM was developed and demonstrated on deformed superconducting Bi(Pb)2223 ceramics. Through visual representation, this method allows for the rapid and efficient analysis of large X‐ray microanalysis datasets and to identify phase composition of fine particles of secondary phases against a background of other phases. The graphical method can be applied using existing software and therefore does not require the development of new programs or complex computations.