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Fractal features of carbon–nickel composite thin films
Author(s) -
Ţălu Ştefan,
Bramowicz Miroslaw,
Kulesza Slawomir,
Dalouji Vali,
Solaymani Shahram,
Valedbagi Shahoo
Publication year - 2016
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/jemt.22779
Subject(s) - materials science , nickel , texture (cosmology) , thin film , sputtering , sputter deposition , composite number , carbon fibers , metal , composite material , deposition (geology) , fractal , metallurgy , chemical engineering , nanotechnology , paleontology , mathematical analysis , mathematics , artificial intelligence , sediment , computer science , engineering , image (mathematics) , biology
Abstract This work analyses the three‐dimensional (3‐D) surface texture of carbon–nickel (C–Ni) films grown by radio frequency (RF) magnetron co‐sputtering on glass substrates. The C–Ni thin films were deposited under different deposition times, from 50 to 600 s, at room temperature. Atomic force microscopy was employed to characterize the 3‐D surface texture data in connection with the statistical, and fractal analyses. It has been found that up to 180 s the sputtering occurs in more metal content mode and in greater than 180 s it occurs in more non‐metal content mode. This behavior demonstrated a strong link between the structural and morphological properties of C–Ni composite films and facilitates a deeper understanding of structure/property relationships and surface defects in prepared samples. Furthermore, these findings can be applied to research on the mechanisms to prepare and control high‐quality C–Ni films.