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Searching events in AFM force‐extension curves: A wavelet approach
Author(s) -
Benítez R.,
Bolós V. J.
Publication year - 2017
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/jemt.22720
Subject(s) - wavelet , energy (signal processing) , extension (predicate logic) , discontinuity (linguistics) , atomic force microscopy , plot (graphics) , force spectroscopy , event (particle physics) , signal (programming language) , algorithm , mathematics , physics , materials science , computer science , statistics , artificial intelligence , mathematical analysis , nanotechnology , astrophysics , programming language
An algorithm, based on the wavelet scalogram energy, for automatically detecting events in force‐extension AFM force spectroscopy experiments is introduced. The events to be detected are characterized by a discontinuity in the signal. It is shown how the wavelet scalogram energy has different decay rates at different points depending on the degree of regularity of the signal, showing faster decay rates at regular points and slower rates at singular points (jumps). It is shown that these differences produce peaks in the scalogram energy plot at the event points. Finally, the algorithm is illustrated in a tether analysis experiment by using it for the detection of events in the AFM force‐extension curves susceptible to being considered tethers. Microsc. Res. Tech. 80:153–159, 2017 . © 2016 Wiley Periodicals, Inc.