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Analysis of dynamic cantilever behavior in tapping mode atomic force microscopy
Author(s) -
Deng Wenqi,
Zhang GuangMing,
Murphy Mark F.,
Lilley Francis,
Harvey David M.,
Burton David R.
Publication year - 2015
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/jemt.22558
Subject(s) - cantilever , vibration , displacement (psychology) , force dynamics , amplitude , non contact atomic force microscopy , particle displacement , atomic force microscopy , materials science , conductive atomic force microscopy , atomic force acoustic microscopy , van der waals force , kelvin probe force microscope , mechanics , phase (matter) , normal mode , mode (computer interface) , acoustics , nanotechnology , magnetic force microscope , chemistry , physics , optics , composite material , engineering , computer science , mechanical engineering , psychotherapist , magnetization , operating system , psychology , quantum mechanics , magnetic field , organic chemistry , molecule
Tapping mode atomic force microscopy (AFM) provides phase images in addition to height and amplitude images. Although the behavior of tapping mode AFM has been investigated using mathematical modeling, comprehensive understanding of the behavior of tapping mode AFM still poses a significant challenge to the AFM community, involving issues such as the correct interpretation of the phase images. In this paper, the cantilever's dynamic behavior in tapping mode AFM is studied through a three dimensional finite element method. The cantilever's dynamic displacement responses are firstly obtained via simulation under different tip‐sample separations, and for different tip‐sample interaction forces, such as elastic force, adhesion force, viscosity force, and the van der Waals force, which correspond to the cantilever's action upon various different representative computer‐generated test samples. Simulated results show that the dynamic cantilever displacement response can be divided into three zones: a free vibration zone, a transition zone, and a contact vibration zone. Phase trajectory, phase shift, transition time, pseudo stable amplitude, and frequency changes are then analyzed from the dynamic displacement responses that are obtained. Finally, experiments are carried out on a real AFM system to support the findings of the simulations. Microsc. Res. Tech. 78:935–946, 2015 . © 2015 Wiley Periodicals, Inc.