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Electron backscatter diffraction applied to lithium sheets prepared by broad ion beam milling
Author(s) -
Brodusch Nicolas,
Zaghib Karim,
Gauvin Raynald
Publication year - 2015
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/jemt.22441
Subject(s) - electron backscatter diffraction , materials science , ion milling machine , scanning electron microscope , focused ion beam , polishing , analytical chemistry (journal) , diffraction , ion beam , x ray photoelectron spectroscopy , lithium (medication) , metallurgy , composite material , ion , microstructure , optics , chemical engineering , chemistry , physics , organic chemistry , layer (electronics) , chromatography , medicine , endocrinology , engineering
ABSTRACT Due to its very low hardness and atomic number, pure lithium cannot be prepared by conventional methods prior to scanning electron microscopy analysis. Here, we report on the characterization of pure lithium metallic sheets used as base electrodes in the lithium‐ion battery technology using electron backscatter diffraction (EBSD) and X‐ray microanalysis using energy dispersive spectroscopy (EDS) after the sheet surface was polished by broad argon ion milling (IM). No grinding and polishing were necessary to achieve the sufficiently damage free necessary for surface analysis. Based on EDS results the impurities could be characterized and EBSD revealed the microsctructure and microtexture of this material with accuracy. The beam damage and oxidation/hydration resulting from the intensive use of IM and the transfer of the sample into the microscope chamber was estimated to be <50 nm. Despite the fact that the IM process generates an increase of temperature at the specimen surface, it was assumed that the milling parameters were sufficient to minimize the heating effect on the surface temperature. However, a cryo‐stage should be used if available during milling to guaranty a heating artefact free surface after the milling process. Microsc. Res. Tech., 78:30ȓ39, 2015 . © 2014 Wiley Periodicals, Inc.