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MRT Letter: An extended scanning probe microscopy system for macroscopic topography imaging
Author(s) -
Fu Ji,
Li Faxin
Publication year - 2014
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/jemt.22415
Subject(s) - microscopy , scanning probe microscopy , materials science , nanotechnology , optics , physics
ABSTRACT Enlightened by the principle of scanning probe microscopy or atomic force microscope (AFM), we proposed a novel surface topography imaging system based on the scanning of a piezoelectric unimorph cantilever. The height of sample surface can be obtained by recording the cantilever's strain using an ultra‐sensitive strain gauge and the Z‐axis movement is realized by electric bending of the cantilever. This system can be operated in the way similar to the contact mode in AFM, with the practical height detection resolution better than 100 nm. Imaging of the inner surface of a steel tube and on a transparent wing of a honey bee were conducted and the obtained results showed that this proposed system is a very promising solution for in situ topography mapping. Microsc. Res. Tech. 77:749–753, 2014 . © 2014 Wiley Periodicals, Inc.