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The role of substrates on the structural, optical, and morphological properties of zno nanotubes prepared by spray pyrolysis
Author(s) -
Vijayalakshmi K.,
Karthick K.
Publication year - 2014
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/jemt.22329
Subject(s) - wurtzite crystal structure , materials science , diffractometer , photoluminescence , sapphire , scanning electron microscope , substrate (aquarium) , chemical engineering , luminescence , thin film , morphology (biology) , nanotechnology , zinc , composite material , optoelectronics , optics , metallurgy , physics , engineering , genetics , geology , laser , oceanography , biology
ZnO films were deposited onto glass, ITO coated glass, and sapphire substrate by spray pyrolysis, and subsequently annealed at the same temperature of 400°C for 3 h. The role of substrate on the properties of ZnO films was investigated. The structural and optical properties of the films were investigated by X‐ray diffractometer (XRD) and photoluminescence (PL) spectrophotometer, respectively. The surface morphology of the nanostructured ZnO film was investigated by scanning electron microscopy (SEM) and atomic force microscopy (AFM). Crystallographic properties revealed that the ZnO films deposited on sapphire and ITO substrates exhibit a strong c ‐axis orientation of grains with hexagonal wurtzite structure. Extremely high UV emission intensity was determined in the film on ITO. The different luminescence behaviors was discussed, which would be caused by least value of strain in the film. Films grown on different substrates revealed differences in the morphology. ZnO films on ITO and sapphire substrates revealed better morphology than that of the film on glass. AFM images of the films prepared on ITO show uniform distribution of grains with large surface roughness, suitable for application in dye sensitized solar cells. Microsc. Res. Tech. 77:211–215, 2014 . © 2013 Wiley Periodicals, Inc.