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Correlative light‐electron fractography for fatigue striations characterization in metallic alloys
Author(s) -
Hein Luis Rogerio de Oliveira,
Oliveira José Alberto,
Campos Kamila Amato
Publication year - 2013
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/jemt.22247
Subject(s) - fractography , correlative , materials science , microscopy , scanning electron microscope , focus (optics) , striation , electron microscope , fracture (geology) , optics , depth of focus (tectonics) , geology , composite material , seismology , physics , tectonics , philosophy , linguistics , subduction
The correlative light‐electron fractography technique combines correlative microscopy concepts to the extended depth‐from‐focus reconstruction method, associating the reliable topographic information of 3‐D maps from light microscopy ordered Z‐stacks to the finest lateral resolution and large focus depth from scanning electron microscopy. Fatigue striations spacing analysis can be precisely measured, by correcting the mean surface tilting with the knowledge of local elevation data from elevation maps. This new technique aims to improve the accuracy of quantitative fractography in fatigue fracture investigations. Microsc. Res. Tech. 76:909–913, 2013 . © 2013 Wiley Periodicals, Inc.