Orientation independent retardation imaging using quantitative polarized phase microscopy | Zendy

Dragomir N.M. | Zendy; Roberts A. | Zendy

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Orientation independent retardation imaging using quantitative polarized phase microscopy

Author(s) -

Dragomir N.M.,

Roberts A.

Publication year - 2012

Publication title -

microscopy research and technique

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.536

H-Index - 118

eISSN - 1097-0029

pISSN - 1059-910X

DOI - 10.1002/jemt.22082

Subject(s) - polarizer , birefringence , optics , polarized light microscopy , polarimetry , polarization (electrochemistry) , polarization microscopy , orientation (vector space) , materials science , microscopy , optical microscope , optical axis , microscope , phase (matter) , transverse plane , physics , scattering , chemistry , mathematics , biology , scanning electron microscope , geometry , quantum mechanics , anatomy , lens (geology)

Simultaneous optical phase and retardation measurement of a birefringent specimen is demonstrated independently of a priori knowledge of the optic axis orientation. The two‐dimensional retardation distribution in both magnitude and angle of the fast axis orientation is uniquely determined from transverse phase images recorded with a bright field transmission microscope using light polarized at a minimum of three different polarization orientations. This approach opens a new possibility for stain‐free phase and orientation‐independent retardation characterization of samples using only one polarizer without needing other additional optical elements traditionally used in polarimetric measurements. Microsc. Res. Tech. 2012. © 2012 Wiley Periodicals, Inc.

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