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Six common errors cause dangerous mistakes in interpretation of electron micrographs
Author(s) -
Moradi Iman,
Behjati Mohaddeseh
Publication year - 2012
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/jemt.21111
Subject(s) - electron micrographs , micrograph , artifact (error) , interpretation (philosophy) , computer science , electron microscope , resolution (logic) , artificial intelligence , optics , scanning electron microscope , physics , programming language
The highly complex techniques of electron microscopy made it bound to the sensitive and critical micrograph analysis. The accurately interpreted micrographs are of paramount values in basic investigations. Interpretation skills and quality of the micrographs are the two fundamental keys in accomplishment of these goals but there are many mistakes and errors that can happen during the sample preparation, sectioning, EM operation, and photo publishing. The mentioned mistakes and errors effect directly in the final result which is a micrograph and can lead the analyzer who can be a pathologist to an interpretation followed by serious danger for patient. Artifacts caused by any given stimuli expected to be bothersome for investigators. Even best qualified equipments can be regarded as source of artifact generation. In this article, seven serious errors in electron micrographs which usually occur in transmission electron microscopy are addressed. Microsc. Res. Tech., 2012. © 2011 Wiley Periodicals, Inc.