Fitting the momentum dependent loss function in EELS | Zendy

Bertoni Giovanni | Zendy; Verbeeck Jo | Zendy; Brosens Fons | Zendy

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Fitting the momentum dependent loss function in EELS

Author(s) -

Bertoni Giovanni,

Verbeeck Jo,

Brosens Fons

Publication year - 2011

Publication title -

microscopy research and technique

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.536

H-Index - 118

eISSN - 1097-0029

pISSN - 1059-910X

DOI - 10.1002/jemt.20894

Subject(s) - function (biology) , momentum (technical analysis) , chemistry , biology , evolutionary biology , economics , financial economics

Momentum dependent inelastic plasmon scattering can be measured by electron energy loss in a transmission electron microscope. From energy filtered diffraction, the characteristic angle of scattering and the cutoff angle are measured, using a thin film of aluminum as a model test. Rather than deconvolving the data (as done in previous works), a fitting technique is used to extract the loss function from angular resolved spectra, starting from a simple model simulation. Microsc. Res. Tech., 2010. © 2010 Wiley‐Liss, Inc.

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