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Fitting the momentum dependent loss function in EELS
Author(s) -
Bertoni Giovanni,
Verbeeck Jo,
Brosens Fons
Publication year - 2011
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/jemt.20894
Subject(s) - function (biology) , momentum (technical analysis) , chemistry , biology , evolutionary biology , economics , financial economics
Momentum dependent inelastic plasmon scattering can be measured by electron energy loss in a transmission electron microscope. From energy filtered diffraction, the characteristic angle of scattering and the cutoff angle are measured, using a thin film of aluminum as a model test. Rather than deconvolving the data (as done in previous works), a fitting technique is used to extract the loss function from angular resolved spectra, starting from a simple model simulation. Microsc. Res. Tech., 2010. © 2010 Wiley‐Liss, Inc.