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Phase‐contrast hard X‐ray microscopy using synchrotron radiation for the diagnosis of onychomycosis
Author(s) -
Lee Onseok,
Ha Seunghan,
Lee Gunwoo,
Kim Jaeyoung,
Huang Jungyun,
Jin Kyeongsik,
Oh Chilhwan
Publication year - 2010
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/jemt.20857
Subject(s) - phase contrast microscopy , synchrotron radiation , microscopy , beamline , synchrotron , x ray , materials science , optics , phase contrast imaging , physics , beam (structure)
Onychomycosis, or fungal infection of the nail, is a disease seen frequently in clinical settings. However, the rates of positive identification using potassium hydroxide preparations or fungal cultures are relatively low. Precise diagnosis is possible via histopathologic examination to monitor the existence of fungus and performance of a fungal culture for confirmation. Phase‐contrast hard X‐ray microscopy using synchrotron radiation provides 70‐nm spatial resolution and enables imaging of minute internal cellular structures. This study confirms the feasibility of diagnosing onychomycosis using a phase‐contrast hard X‐ray microscope developed at 1B2 beam line using a Pohang light source. Microsc. Res. Tech. 73:1110–1114, 2010. © 2010 Wiley‐Liss, Inc.