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Demonstration of high lateral resolution in laser confocal microscopy using annular and radially polarized light
Author(s) -
Kim Jeongyong,
Kim DaeChul,
Back SengHun
Publication year - 2009
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/jemt.20689
Subject(s) - optics , materials science , confocal , microscopy , polarization (electrochemistry) , light sheet fluorescence microscopy , laser , optical sectioning , resolution (logic) , polarized light microscopy , confocal microscopy , numerical aperture , microscope , super resolution microscopy , total internal reflection , linear polarization , confocal laser scanning microscopy , scanning confocal electron microscopy , physics , chemistry , biophysics , wavelength , artificial intelligence , computer science , biology
The authors present the experimental result of improved lateral resolution in laser confocal microscopy (LCM) by using annular and radially polarized light as the input illumination of an existing LCM. The authors examined the lateral resolution of the LCM by imaging a single fluorescent bead and measuring the lateral width of the single bead profile appearing in the optical image. Compared to no aperture and linearly polarized light, the central peak of the single bead profile narrowed by ∼40%, being as small as 122 nm in full width at half maximum using 405 nm laser excitation in a reflection imaging. In addition, the authors showed that radial polarization helps to preserve the circular shape of the single bead profile whereas linearly polarized light tends to induce an elongation along the polarization direction. Microsc. Res. Tech., 2009. © 2009 Wiley‐Liss, Inc.