Advances in atomic resolution in situ environmental transmission electron microscopy and 1Å aberration corrected in situ electron microscopy | Zendy

Gai Pratibha L. | Zendy; Boyes Edward D. | Zendy

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Advances in atomic resolution in situ environmental transmission electron microscopy and 1Å aberration corrected in situ electron microscopy

Author(s) -

Gai Pratibha L.,

Boyes Edward D.

Publication year - 2009

Publication title -

microscopy research and technique

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.536

H-Index - 118

eISSN - 1097-0029

pISSN - 1059-910X

DOI - 10.1002/jemt.20668

Subject(s) - in situ , transmission electron microscopy , electron microscope , scanning transmission electron microscopy , scanning confocal electron microscopy , high resolution transmission electron microscopy , materials science , microscopy , energy filtered transmission electron microscopy , resolution (logic) , optics , analytical chemistry (journal) , nanotechnology , chemistry , physics , computer science , organic chemistry , chromatography , artificial intelligence

Advances in atomic resolution in situ environmental transmission electron microscopy for direct probing of gas‐solid reactions, including at very high temperatures (∼2000°C) are described. In addition, recent developments of dynamic real time in situ studies at the Angstrom level using a hot stage in an aberration corrected environment are presented. In situ data from Pt/Pd nanoparticles on carbon with the corresponding FFT/optical diffractogram illustrate an achieved resolution of 0.11 nm at 500°C and higher in a double aberration corrected TEM/STEM instrument employing a wider gap objective pole piece. The new results open up opportunities for dynamic studies of materials in an aberration corrected environment. Microsc. Res. Tech., 2009. © 2009 Wiley‐Liss, Inc.

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