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Two‐probe electrical measurements in transmission electron microscopes—Behavioral control of tungsten microwires
Author(s) -
Costa Pedro M.F.J.,
Fang Xiaosheng,
Wang Shiliang,
He Yuehui,
Bando Yoshio,
Mitome Masanori,
Zou Jin,
Huang Han,
Golberg Dmitri
Publication year - 2009
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/jemt.20648
Subject(s) - ohmic contact , materials science , transmission electron microscopy , tungsten , electrode , electron microscope , microscope , stiffness , electron , optoelectronics , optics , nanotechnology , composite material , chemistry , physics , layer (electronics) , metallurgy , quantum mechanics
Tungsten microwires have been manipulated and electrically probed inside a transmission electron microscope. Using Au electrodes, the current–voltage characteristics of the W structures were extracted. These showed highly variable behaviors dependent on various factors, the most important of these being orientation and stiffness of the contact. Careful control of loading force and Au–W contact angle enabled a considerable degree of behavior tailoring from nonlinear to Ohmic responses. Microsc. Res. Tech., 2009. © 2008 Wiley‐Liss, Inc.