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MRT letter: Full‐tilt electron tomography with a piezo‐actuated rotary drive
Author(s) -
Xu X.J.,
Lockwood A.,
Guan W.,
Gay R.,
Saghi Z.,
Wang J.J.,
Peng Y.,
Inkson B.J.,
Möbus G.
Publication year - 2008
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/jemt.20645
Subject(s) - goniometer , miniaturization , tilt (camera) , piezoelectricity , electron tomography , materials science , optics , transmission electron microscopy , acoustics , mechanical engineering , scanning transmission electron microscopy , physics , nanotechnology , engineering , composite material
Piezoelectric nanoactuation, which is rapidly becoming established as state‐of‐the‐art positioning control in transmission electron microscopy (TEM), is extended here to include a rotational degree of freedom. A piezoelectric goniometer with both translational and rotary drive action has been designed with high level of miniaturization to fit into a standard TEM specimen holder shaft without compromising any of the performance of the default TEM goniometer and without any modifications to the TEM. Enhanced functionality of such a goniometer‐in‐goniometer is outlined and experimental results for electron tomography of nanostructures over a full tilt range of views, without any missing angles, are demonstrated. Microsc. Res. Tech., 2008. © 2008 Wiley‐Liss, Inc.