MRT letter: Full‐tilt electron tomography with a piezo‐actuated rotary drive | Zendy

Xu X.J. | Zendy; Lockwood A. | Zendy; Guan W. | Zendy; Gay R. | Zendy; Saghi Z. | Zendy; Wang J.J. | Zendy; Peng Y. | Zendy; Inkson B.J. | Zendy; Möbus G. | Zendy

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MRT letter: Full‐tilt electron tomography with a piezo‐actuated rotary drive

Author(s) -

Xu X.J.,

Lockwood A.,

Guan W.,

Gay R.,

Saghi Z.,

Wang J.J.,

Peng Y.,

Inkson B.J.,

Möbus G.

Publication year - 2008

Publication title -

microscopy research and technique

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.536

H-Index - 118

eISSN - 1097-0029

pISSN - 1059-910X

DOI - 10.1002/jemt.20645

Subject(s) - goniometer , miniaturization , tilt (camera) , piezoelectricity , electron tomography , materials science , optics , transmission electron microscopy , acoustics , mechanical engineering , scanning transmission electron microscopy , physics , nanotechnology , engineering , composite material

Piezoelectric nanoactuation, which is rapidly becoming established as state‐of‐the‐art positioning control in transmission electron microscopy (TEM), is extended here to include a rotational degree of freedom. A piezoelectric goniometer with both translational and rotary drive action has been designed with high level of miniaturization to fit into a standard TEM specimen holder shaft without compromising any of the performance of the default TEM goniometer and without any modifications to the TEM. Enhanced functionality of such a goniometer‐in‐goniometer is outlined and experimental results for electron tomography of nanostructures over a full tilt range of views, without any missing angles, are demonstrated. Microsc. Res. Tech., 2008. © 2008 Wiley‐Liss, Inc.

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