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Retrieval of absorptive potential variation in electron beam sensitive specimens using a single energy‐filtered bright‐field TEM image
Author(s) -
Bhattacharyya Somnath,
Jinschek Joerg R.
Publication year - 2008
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/jemt.20607
Subject(s) - transmission electron microscopy , energy (signal processing) , cathode ray , variation (astronomy) , materials science , electron , beam (structure) , transmission (telecommunications) , optics , physics , nanotechnology , computer science , quantum mechanics , astrophysics , telecommunications
A method is presented for retrieving the variation of the absorptive potential in electron beam sensitive soft material. The absorptive potential is directly related to the variations in atomic density and in chemical composition fluctuation. In our approach only a single zero‐loss energy‐filtered bright‐field transmission electron microscopy (TEM) image is sufficient to obtain this information. The accuracy and the effectiveness of this proposed method has been tested using both simulation and experiment. As an experimental example of soft (organic) material, the variation in absorptive potential in an unstained tissue sample of zebrafish gill has been determined. Microsc. Res. Tech., 2008. © 2008 Wiley‐Liss, Inc.