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High resolution X‐ray phase contrast synchrotron imaging of normal and ligation damaged rat sciatic nerves
Author(s) -
Kim BongIl,
Kim KiHong,
Youn HwaShik,
Jheon Sanghoon,
Kim JongKi,
Kim Hongtae
Publication year - 2008
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/jemt.20571
Subject(s) - wallerian degeneration , sciatic nerve , phase contrast imaging , materials science , synchrotron , biomedical engineering , anatomy , phase contrast microscopy , medicine , optics , physics
Abstract This study was performed to apply synchrotron radiation (SR) imaging to a neuropathologic evaluation technique after treatment of peripheral nerve blocks. A phase contrast synchrotron images of normal and ligation damaged rat sciatic nerve were obtained with an 8 KeV monochromatic beam and 20‐μm thick CsI(TI) scintillation crystal. The visual image was magnified using a 20× microscope objective and captured using an analog CCD camera. Obtained images were compared with conventional light microscopic findings from the same nerve samples. By using an edge enhancement effect of phase const with SR, we could easily discriminate each nerve fiber and identify the arrangement of nerve fibers within a whole thickness (about 1 mm in diameter) of peripheral nerve without sectioning and fixation. The composite SR image of a ligation damaged rat sciatic nerve sample showed that the response to nerve injury was different on each side of the site of injury. The SR image of damaged distal lesion showed destruction of neural microarchitecture and typical extensive Wallerian degeneration of nerve fibers as clearly as histologic image. We could get very detailed morphologic data for Wallerian degeneration of nerve fibers by using the SR imaging technique. We believe that the phase contrast synchrotron imaging has great potential as an imaging tool in the bioscience and medical science. Microsc. Res. Tech., 2008. © 2008 Wiley‐Liss, Inc.