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Rapid and accurate measurement for phase‐change optical recording bits
Author(s) -
Chen SyHann
Publication year - 2007
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/jemt.20415
Subject(s) - initialization , optics , digital recording , resolution (logic) , computer science , phase (matter) , phase change , materials science , process (computing) , optical recording , laser , optoelectronics , computer hardware , physics , artificial intelligence , engineering physics , quantum mechanics , programming language , operating system
Conducting atomic force microscopy (CAFM) and scanning surface potential microscopy (SSPM) have been used to image the phase‐change optical recording bits. Commercially available digital versatile discs (DVD) + rewritable (RW) with initialization process were measured in experiments. Comparing the measurement results of both, the measurement resolution of CAFM is far superior to that of SSPM. With the DVD + RW disc rotating at a linear speed of 3.5 m/s, appropriate writing laser power range, may be precisely identified by CAFM as 10–15 mW. This is sufficient to verify the high‐resolution recording bits research method. This new method may also be applied to the development of new types of phase‐change recording materials. Microsc. Res. Tech., 2007. © 2007 Wiley‐Liss, Inc.