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Manipulation, dissection, and lithography using modified tapping mode atomic force microscope
Author(s) -
Liu Zhiguo,
Li Zhuang,
Wei Gang,
Song Yonghai,
Wang Li,
Sun Lanlan
Publication year - 2006
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/jemt.20379
Subject(s) - tapping , atomic force microscopy , nanotechnology , lithography , materials science , mode (computer interface) , setpoint , optoelectronics , physics , computer science , acoustics , artificial intelligence , operating system
A modified tapping mode of the atomic force microscope (AFM) was introduced for manipulation, dissection, and lithography. By sufficiently decreasing the amplitude of AFM tip in the normal tapping mode and adjusting the setpoint, the tip‐sample interaction can be efficiently controlled. This modified tapping mode has some characteristics of the AFM contact mode and can be used to manipulate nanoparticles, dissect biomolecules, and make lithographs on various surfaces. This method did not need any additional equipment and it can be applied to any AFM system. Microsc. Res. Tech., 2006. © 2006 Wiley‐Liss, Inc.