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AFM study of the plastic deformation of polysynthetically‐twinned (PST) TiAI crystals in soft orientation
Author(s) -
Chen Yali,
Pope David P.
Publication year - 2006
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/jemt.20292
Subject(s) - lamellar structure , materials science , deformation (meteorology) , anisotropy , shear (geology) , composite material , deformation mechanism , crystallography , optics , microstructure , chemistry , physics
PST TiAl samples with a nominal composition of Ti 52 Al 48 were deformed at room temperature with compression axis inclined to the lamellar interfaces by 45° and one of the side surface normal directions set to be 〈11 $\bar{2}$ 〉. The deformation structures on the free surfaces of the deformed samples were investigated using Atomic Force Microscope (AFM). It was found that in‐plane shear (shear in planes parallel to lamellar interfaces) is the dominant deformation mode in all γ domains and most of the deformation traces on the free surfaces are parallel to lamellar interfaces. Out‐of‐plane shear (shear in planes inclined to lamellar interfaces) also occurs but contributes much less to the macroscopic strain. This selective activation of deformation modes leads to a highly anisotropic deformation behavior in PST crystals with this orientation. Microsc. Res. Tech. 69:366–373, 2006. © 2006 Wiley‐Liss, Inc.