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Mechanically engraved mica surface using the atomic force microscope tip facilitates return to a specific sample location
Author(s) -
Liu Zhiguo,
Li Zhuang,
Zhou Hualan,
Wei Gang,
Song Yonghai,
Wang Li
Publication year - 2005
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/jemt.20158
Subject(s) - mica , atomic force microscopy , sample (material) , conductive atomic force microscopy , surface (topology) , microscope , optics , engraving , materials science , microscopy , magnetic force microscope , chemistry , nanotechnology , composite material , physics , geometry , chromatography , mathematics , magnetization , quantum mechanics , magnetic field
By controlling the interaction between the atomic force microscope tip and mica, patterns of different sizes and shape have been produced on the surface of mica. Using these operator‐constructed patterns as a reliable marker, the original scanned sample location can be re‐located and imaged again on the same mica surface by atomic force microscopy (AFM). This location technique can be used to find the same object again even if the sample was removed from the AFM instrument or the sample was imaged in a different mode. Microsc. Res. Tech. 66:156–162, 2005. © 2005 Wiley‐Liss, Inc.